SEM and EDS can work independently, but when combined, they form a robust tool known as SEM-EDS which provides both morphological and compositional information about samples at a microscopic level.
As modern technology continues to evolve, techniques to analyze the microscopic world have continually evolved. One of these techniques is scanning electron microscopy-energy dispersive x-ray spectroscopy (SEM-EDS). SEM-EDS is the combination of two robust analytical techniques, SEM and EDS, aimed at achieving surface morphology, elemental composition and other information. Thereinto, SEM utilizes a focused beam of high-energy electrons to yield information about the sample's surface topography and properties such as electrical conductivity. In contrast, EDS focuses on the elemental analysis and chemical characterization of a sample. SEM-EDS allows for both structural and elemental examination of a variety of samples, from metals to biological material, and from powders to solid components.
Principle of SEM-EDS
The SEM-EDS technique involves two critical procedures. Initially, an SEM generates an electron beam that scans the sample surface. When this beam strikes the sample, it produces different signals, including secondary electrons, backscattered electrons, and characteristic X-rays, all of which can be detected and analyzed to provide valuable information about the specimen's morphology and size of various sample characteristics. Subsequently, during the SEM process, the high-energy electrons interacting with the specimen generate X-rays, which are detected by EDS. Rooted in the principle of the characteristic X-rays generated by each element on the periodic table, the EDS can identify the elements present in the sample and determine their relative abundances.
What is SEM-EDS Used For?
SEM-EDS enables focused examination of sample surface morphology and elemental composition of samples. These methods are commonly employed in material surface analysis, dimensional analysis, particle identification, product failure investigation, deformulation and reverse engineering, contaminant identification, process characterization, solder joint analysis, and other applications. Samples that can be detected include nanomaterials, thin film materials, coatings and paints, metals and alloys, medical devices, plastics, textiles, ceramics, biomedical materials, etc. Some typical applications are as follows:
- SEM-EDS can be used to analyze the size, shape, and chemical composition of nanoparticles, which are important in various fields such as nanotechnology, medicine, and environmental science.
- Film layer analysis is another area where SEM-EDS finds application. This analysis involves determining the thickness of a film. The beauty of SEM is that it can show not just one layer of the film, but several. What is more, with the incorporation of EDS, it becomes possible to compare the chemical compositions between each layer, something invaluable in research and industrial applications.
- Moreover, the SEM-EDS technique is abundantly employed for metals testing. Analysis under SEM allows for the detailed examination of metal surface topography images, making it an essential tool for fractography, diagnosing embrittlement, conducting corrosion analysis and determining alloy compositions.
Application of SEM-EDS in Deformulation
Deformulation involves breaking down and identifying the component materials in a system. SEM-EDS plays a critical role here in determining the elemental composition and the morphology of these components. With SEM-EDS, researchers can managed to deformulate and understand the structure of various materials such as metal & alloy, coatings, paints, polymers, inks, cosmetics, pharmaceuticals, medical devices and many more. Its functions are manifested in the following aspects:
- Component identification: SEM-EDS can be used to determine the type, size, and distribution of particles within a complex matrix. This information can be further used to help identify individual components of a product.
- Quantitative analysis: By comparing signal intensities, SEM-EDS can provide quantitative information about the elemental composition of a product. This is helpful to know the concentration of different elements in a mixture.
- Precise measurements: SEM-EDS can provide high-resolution images of the components in a product. This can help to know the structural information of each component in detail.
- Impurity analysis: With highly sensitive detectors, SEM-EDS can detect even trace elements present in a product or formulation.
How We Can Help You?
Our team is equipped with expertise in handling SEM-EDS, and state-of-the-art SEM-EDS equipment. Our SEM-EDS equipment features:
- An in-lens detector that can capture high-resolution images down to approximately 1nm at an acceleration voltage of around 1kV.
- The variable pressure mode (VP) that enables analysis of insulating samples without the need for metallization, allowing for non-destructive analysis of all types of materials.
- The 80mm2 Energy-dispersive X-ray probe that enables semi-quantitative chemical analysis and mapping, even on lighter elements.
Whether you wish to investigate the microstructure of your sample, perform comprehensive deformulation, or need chemical composition analysis, we can assist you with your requirements.
Our SEM-EDS service ensures high quality, reliable results. Let our professional team assist you to move forward in your research, development, and innovation journey.
Please kindly note that our products and services are for research use only.
