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Materials Characterization and Analysis Service—JEOL 2010 Advanced High Performance TEM

Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on JEOL 2010 Advanced High Performance TEM.

Name Of The Instrument/Platform

JEOL 2010 Advanced High Performance TEM

MANUFACTURER: JEOL

Summary

This instrument is an advanced, digitally controlled dedicated transmission electron microscope operating at 200KV with a lanthanum hexaboride cathode. It is capable of an µLtimate point-to-point resolution of 0.19 nm, with the ability to image lattice fringes at 0.14 nm resolution.

Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our JEOL 2010 Advanced High Performance TEM-based materials analysis services, please contact us directly.

For research use only, not intended for any clinical use.

Online Inquiry

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