In recent years, the new materials industry, especially the nanomaterials industry, has been growing with the increasing scientific research on new materials technology and nanotechnology, which has placed new and higher demands on the metrology work in the related fields. Nanomaterials metrology services are an area of expertise for Alfa Chemistry and we can provide our customers with solutions based on XRF.
XRF
MANUFACTURER: SPECTRO
MODEL: XEPOS III
The unit is delivered including a prepared analysis method. Data are already stored in the unit's memory. The measured values are compared with these data. After the measurement is complete, the results relating to an unknown sample are displayed on the screen. The sample material can be solid, liquid or a powder.
X-rays excite the atoms of the sample to emit radiation. This radiation is measured by a semiconductor detector. To achieve a higher sensitivity, the exciting radiation can be optimized by using targets.
Alfa Chemistry' Nanomaterials Analysis Laboratory can provide XRF-based nanomaterials metrology services to our clients. If you would like to receive details of this project, please contact us directly.
For research use only, not intended for any clinical use.
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