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Materials Characterization and Analysis Service—Bruker Tracer-III SD Portable XRF

Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on Bruker Tracer-III SD Portable XRF.

Name Of The Instrument/Platform

Bruker Tracer-III SD Portable XRF

MANUFACTURER: Bruker

Introduction

It features a rhodium X-ray source and a silicon-based detector and is capable of identifying most elements heavier than magnesium in three minutes or less with a spectrum from 1-40 keV. Normally it gives qualitative results, e.g. trace element identification and relative comparisons of similar samples. Quantitative analysis is possible but more difficult, because the user must create a set of calibration standards for each element of interest.

Summary

This energy dispersive X-ray fluorescence (ED-XRF) unit provides rapid qualitative non-destructive elemental analysis.

Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our Bruker Tracer-III SD Portable XRF-based materials analysis services, please contact us directly.

For research use only, not intended for any clinical use.

Online Inquiry

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