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Materials Characterization and Analysis Service—FEI/Philips XL30 FEG ESEM

Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on FEI/Philips XL30 FEG ESEM.

Name Of The Instrument/Platform

FEI/Philips XL30 FEG ESEM

MANUFACTURER: FEI

Summary

A high performance, extremely flexible and well-equipped microscope for general-purpose microscopy, low-vacuum and environmental scanning microscopy (ESEM). It is also equipped with a Peltier stage. Resolution at 30KV is 3.5 nm. The minimum magnification is about 20×.

Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our FEI/Philips XL30 FEG ESEM-based materials analysis services, please contact us directly.

For research use only, not intended for any clinical use.

Online Inquiry

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