Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on FIB: Zeiss Auriga Crossbeam FIB/SEM.
FIB: Zeiss Auriga Crossbeam FIB/SEM
MANUFACTURER: Zeiss
The Zeiss Dual Beam FIB/SEM instrument is not only used as high-resolution Scanning electron microscope but can be used together with an scanning focused ion beam. Uses include TEM sample preparation and micro-machining. We can also slice and image successively to get tomographic 3D images of small objects from cells to proteins and nano-wires.
Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our FIB: Zeiss Auriga Crossbeam FIB/SEM-based materials analysis services, please contact us directly.
For research use only, not intended for any clinical use.
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Alfa Chemistry provides customized laboratory services to research institutes, universities, and other institutions in the field of chemistry and materials. Our mission is to provide you with comprehensive and powerful technical support.
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