Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on FEI Tecnai F30 TEM.
FEI Tecnai F30 TEM
MANUFACTURER: FEI
The FEI Tecnai F30 is an analytical electron microscope (AEM), which can function as a conventional transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM). It has a field emission gun (FEG) and it can operate up to an accelerating voltage of 300KV. It includes both an energy dispersive x-ray detector (XEDS) and an electron energy loss spectrometer for elemental analysis. The probe size can be reduced to < 0.2 nm for chemical analysis and nano-diffraction studies.
1. 0.20 nm point-to-point resolution in TEM mode
2. 0.14 nm point-to-point resolution in STEM mode
3. Information limit < 0.1 nm
4. Heating and cryo-stages for in situ experimentation
5. Gatan Multiscan 794 digital camera
6. HAADF/ADF/BF STEM Detectors
7. GIF200 Electron energy loss spectrometer
8. Gatan image filter (GIF) for EFTEM elemental mapping
9. 300, 200, 120 kV accelerating voltages available
10. MacTempas software for image analysis and HRTEM/HRSTEM simulations
Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our FEI Tecnai F30 TEM-based materials analysis services, please contact us directly.
For research use only, not intended for any clinical use.
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