Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on FEI Helios Nanolab 600 Dual Beam System (FIB/SEM).
FEI Helios Nanolab 600 Dual Beam System (FIB/SEM)
MANUFACTURER: FEI
This instrument has magnetic immersion electron optics to give 0.9 nm resolution at 15kV. A high brightness field electron emitter can deliver a beam current up to 22 nA and the accelerating voltage from 350V to 30kV. The ion optics produces a resolution of 5.0 nm at 30KV and liquid Gallium emitter delivers 20 nA ion current and the voltage ranging from 0.5 kV to 30 kV.
Configured to carry out nano-scale characterization and nano-machining on a wide-range of materials from various study areas such as biotechnology, and materials and energy research.
Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our FEI Helios Nanolab 600 Dual Beam System (FIB/SEM)-based materials analysis services, please contact us directly.
For research use only, not intended for any clinical use.
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Alfa Chemistry provides customized laboratory services to research institutes, universities, and other institutions in the field of chemistry and materials. Our mission is to provide you with comprehensive and powerful technical support.
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