In recent years, as scientists continue to research more and more into materials science, the new materials industry, especially the nanomaterials industry, has grown and developed, placing new and higher demands on metrology in related fields. Metrology services are an area of expertise for Alfa Chemistry and we can provide our customers with solutions based on Filmetrics F54-UV Reflectometer.
Filmetrics F54-UV Reflectometer
Wavelengths: 190 nm to 1100 nm
Thickness Range: 4 nm to 35 µm
Minimum Feature Size: 25 µm
Substrate Size: 200 mm or smaller
The Filmetrics F54-UV is a film thickness measurement system that utilizes a small spot spectroscopic reflectometer that is coupled with an intuitive and capable software package. With dual halogen and deuterium lamps, the system takes precise measurements of single and multi-layer film stacks, measuring thicknesses ranging from 4 nanometers to 35 microns. The software allows the user to configure measurement recipes for both simple and advanced measurement applications with the ability to select film constants, scan ranges and substrate types. Additionally, the motorized stage allows for measurement of virutally any substrate, and the 25 micron spot size allows for the analysis of patterned films.
The Materials Analysis Laboratory at Alfa Chemistry can provide Filmetrics F54-UV Reflectometer-based metrology services to our clients. If you would like to receive details of this project, please contact us directly.
For research use only, not intended for any clinical use.
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