Elemental Analysis Service—Cameca SXFive Electron Microprobe

Elemental analysis is a chemical analysis method for studying the composition of elements in organic compounds. There are two types of analysis: qualitative and quantitative. Alfa Chemistry has some elemental analyzers that can provide tailor-made solutions for a wide range of samples and concentrations. Our Cameca SXFive Electron Microprobe-based elemental analysis services can help you to obtain real data with precision and efficiency.

Name Of The Instrument/Platform

Cameca SXFive Electron Microprobe

Introduction

The microprobe, sometimes referred to as EMP (electron microprobe) or simply "probe"-are equipped as follows:
1. Tungsten source
2. Five wavelength dispersive spectrometers with 140 mm Rowland circle and the following analysing crystals and detectors:
1) LTAP/LPET, P10 detector
2) PET/TAP/PC0/PC2, P10 detector
3) LPET/LLIF, HP P10 detector
4) TAP/LPET, P10 detector
5) LPET/LLIF, HP P10 detector
3. Computer control by Cameca Peak Sight 6.1 and Probe Software Inc. "Probe for EPMA" and "Probe Image" software packages
4. Integrated Röntec X-Flash 5010 Be-window SDD EDS with Bruker Quantax 2.1.1 Esprit software (elements Na-U)
5. Cameca SE, BSE and CL detectors
6. Built-in reflected light optical microscope
7. Oil-free vacuum system with ion, turbomolecular and scroll pumps

Feature Highlights

1. Superior energy resolution using Wavelength dispersive X-ray analysis i.e.10eV (cf 140eV with conventional EDXS), enabling the researcher to resolve problematic overlaps during analysis of X-ray spectra.
2. Capacity to provide quantitative elemental analysis via calibration of x-ray data against reference standard materials.
3. The SXFive is equipped with large diffracting crystals and software ability to sum spectrometers can give low 10's ppm detection limit for some elements.
4. Ability to map over large areas, i.e. up to 75 mm × 50 mm via stage mapping, and on the SXFive give fully quantitative ZAF corrected x-ray maps.
5. Improved capability for multi-element imaging. Whilst major elements are being imaged using the integrated EDS software trace elements requiring better detection limits or energy resolution are being mapped using WDS at the same time.

Important Notes

Recommended Sample Size:
1. Polished Blocks - Different resin mount holders allow 3×35 mm or 6×25 mm diameter samples at one time. Blocks must have a 20 mm max height but ideally ~10 mm.
2. Polished Slides - Slide holder allows up to 3× 47 × 25 mm, 1× 75 × 50 mm, OR 1× 75 × 25 mm at a time.

Summary

The Electron Microprobe is a very powerful tool that uses certified standards and X-ray analysis to accurately identify and quantify major and minor element concentrations in a polished sample at the spatial resolution of an electron beam instrument.
The Wavelength Dispersive Spectrometers (WDS) equipped on the microprobes allow for superior X-ray energy resolution over typical EDS detection used in a Scanning Electron Microscope (SEM).The extended stage movement allows for x-ray mapping in which the spatial distribution of elements can be recorded over a large area revealing information about chemical zonation. Microanalysis using the Electron Microprobe can be applied to a wide range of materials including: geological samples, biomaterials (bone and teeth) and engineered materials (metals and ceramics).

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For research use only, not intended for any clinical use.

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Elemental Analysis Service—Cameca SXFive Electron Microprobe

Name Of The Instrument/Platform

Introduction

Feature Highlights

Important Notes

Summary

Related Services

Online Inquiry